Ultra-low-noise microwave system

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Publié le dimanche 26 avril 2026 08:30

TOPTICA Photonics launches the X-MMS (X-band Metrological Microwave Solution), a system that delivers an ultra-low-noise microwave signal. At the heart of this innovation lies a photonic approach that departs from conventional electronic microwave generation. Instead, X-MMS derives its signal from an extremely stable optical reference. Using optical frequency division, the exceptional stability of a laser is transferred into the microwave domain, producing a 9.6 GHz signal with outstanding spectral purity and stability.

The reported performance places the system among the global benchmarks. The single-sideband phase noise reaches –102 dBc/Hz at 1 Hz offset and drops below –166 dBc/Hz at higher offset frequencies. In addition, the fractional frequency instability can be as low as 2.8 × 10⁻¹⁶ at 1 second averaging time, levels essential for the most demanding applications.

Such performance is particularly relevant for fields including atomic clocks, radio astronomy, frequency metrology, and emerging quantum technologies, where the quality of the microwave signal directly impacts timing precision, synchronization, and measurement accuracy.

The core of the system is based on a Difference Frequency Comb, enabling intrinsically offset-free operation and contributing to both ultra-low noise and long-term stability. The platform can also be referenced to external standards such as atomic clocks or GPS signals, ensuring full SI traceability for real-world deployment.

Beyond its technical performance, X-MMS reflects a broader trend in photonics: the maturation of advanced laser and frequency comb technologies into robust, integrated tools for industrial use. By making metrology-grade microwave signals accessible outside specialized laboratories, it opens new opportunities for high-end RF development, as well as faster and more precise test and measurement capabilities.

https://www.toptica.com
https://www.toptica.com/downloads/whitepapers/white-paper_TOPTICA_X-band-metrological-microwave-solution.pdf